{"id":625,"date":"2017-03-17T09:44:53","date_gmt":"2017-03-17T08:44:53","guid":{"rendered":"http:\/\/www.uach.sav.sk\/sk\/?page_id=625"},"modified":"2020-07-06T15:11:23","modified_gmt":"2020-07-06T13:11:23","slug":"fazova-mikrostrukturna-a-chemicka-analyza","status":"publish","type":"page","link":"https:\/\/uach.sav.sk\/sk\/veda-a-vyskum\/pristrojove-vybavenie\/fazova-mikrostrukturna-a-chemicka-analyza\/","title":{"rendered":"F\u00e1zov\u00e1, mikro\u0161trukt\u00farna a chemick\u00e1 anal\u00fdza"},"content":{"rendered":"<p><strong><img loading=\"lazy\" decoding=\"async\" class=\"size-medium wp-image-658 alignright\" src=\"http:\/\/www.uach.sav.sk\/sk\/wp-content\/uploads\/sites\/2\/1_SEM_BA-300x227.jpg\" alt=\"\" width=\"300\" height=\"227\" srcset=\"https:\/\/uach.sav.sk\/sk\/wp-content\/uploads\/sites\/2\/1_SEM_BA-300x227.jpg 300w, https:\/\/uach.sav.sk\/sk\/wp-content\/uploads\/sites\/2\/1_SEM_BA.jpg 437w\" sizes=\"auto, (max-width: 300px) 100vw, 300px\" \/>Skenovac\u00ed elektr\u00f3nov\u00fd mikroskop JEOL EVO\u00ae 40 Series (Bratislava)<\/strong><\/p>\n<p><u><br \/>\nZodpovedn\u00fd pracovn\u00edk<\/u>: Anna Jurov\u00e1 e-mail: <a href=\"mailto:anna.jurova@savba.sk\">anna.jurova@savba.sk<\/a><\/p>\n<ul>\n<li>Pr\u00edstroj na detailn\u00fa mikro\u0161trukt\u00farnu a\u00a0chemick\u00fa anal\u00fdzu (EDS) materi\u00e1lov,<\/li>\n<li>rozl\u00ed\u0161enie 3.0 nm pri 30 kV; ur\u00fdch\u013eovacie nap\u00e4tie 0.2 to 30 kV.<\/li>\n<\/ul>\n<p>&nbsp;<\/p>\n<p>&nbsp;<\/p>\n<p>&nbsp;<\/p>\n<p>&nbsp;<\/p>\n<p><strong>Skenovac\u00ed elektr\u00f3nov\u00fd mikroskop JEOL JSM-7600 F\/EDS\/WDS\/EBSD (Tren\u010d\u00edn)<\/strong><\/p>\n<p><u><img loading=\"lazy\" decoding=\"async\" class=\" wp-image-661 alignright\" src=\"http:\/\/www.uach.sav.sk\/sk\/wp-content\/uploads\/sites\/2\/1_SEM_TR-161x300.jpg\" alt=\"\" width=\"180\" height=\"335\" srcset=\"https:\/\/uach.sav.sk\/sk\/wp-content\/uploads\/sites\/2\/1_SEM_TR-161x300.jpg 161w, https:\/\/uach.sav.sk\/sk\/wp-content\/uploads\/sites\/2\/1_SEM_TR.jpg 330w\" sizes=\"auto, (max-width: 180px) 100vw, 180px\" \/><br \/>\n<\/u><\/p>\n<p>Chemick\u00e1 a mikro\u0161trukt\u00farna anal\u00fdza keramick\u00fdch kompozitov, identifik\u00e1cia distrib\u00facie sekund\u00e1rnych f\u00e1z v kompozitoch, identifik\u00e1cia a charakteriz\u00e1cia korodovan\u00fdch povrchov a kor\u00f3znych produktov skla a keramick\u00fdch materi\u00e1lov, anal\u00fdza nehomogen\u00edt v skle, charakteriz\u00e1ciu produktov kry\u0161taliz\u00e1cie pri \u0161t\u00fadiu mechanizmov kry\u0161taliz\u00e1cie skiel.<\/p>\n<ul>\n<li>Rozl\u00ed\u0161enie pri ur\u00fdch\u013eovacom nap\u00e4t\u00ed 15kV min. 1-2nm, pri 1kV min.2-4nm, vybaven\u00fd analytick\u00fdmi modulmi 1xWDS detektorom, 1xSDD detektorom, 1xEBSD detektorom, vr\u00e1tane datab\u00e1zov\u00e9ho softwaru na vyhodnocovanie EBSD spektier.<\/li>\n<\/ul>\n<p><u>I\u00f3nov\u00e1 napra\u0161ova\u010dka<\/u> &#8211; JEOL JFC-1300 \u201eAUTO Sputter Coater\u201c, JEOL JEC-520 \u201eCarbon Coater\u201c, Tren\u010d\u00edn<\/p>\n<p>Zariadenie sl\u00fa\u017ei na pokovovanie elektricky nevodiv\u00fdch vzoriek pre elektr\u00f3nov\u00fa mikroskopiu s mo\u017enos\u0165ou nan\u00e1\u0161ania kovov\u00fdch (Au, Pt, Au\/Pd) alebo uhl\u00edkov\u00fdch povlakov pre EDX anal\u00fdzu. Umo\u017e\u0148uje \u00fapravu povrchu nevodiv\u00fdch materi\u00e1lov napra\u0161ovan\u00edm vrstiev zlata, striebra, platiny, ich zliatiny, zliatiny zlata a\u00a0pal\u00e1dia, uhl\u00edka zo zdroja vybuden\u00edm plazmou.<\/p>\n<p>&nbsp;<\/p>\n<p><strong><img loading=\"lazy\" decoding=\"async\" class=\" wp-image-664 alignright\" src=\"http:\/\/www.uach.sav.sk\/sk\/wp-content\/uploads\/sites\/2\/2_XRD-251x300.jpg\" alt=\"\" width=\"277\" height=\"331\" srcset=\"https:\/\/uach.sav.sk\/sk\/wp-content\/uploads\/sites\/2\/2_XRD-251x300.jpg 251w, https:\/\/uach.sav.sk\/sk\/wp-content\/uploads\/sites\/2\/2_XRD.jpg 465w\" sizes=\"auto, (max-width: 277px) 100vw, 277px\" \/>R\u00f6ntgenov\u00fd pr\u00e1\u0161kov\u00fd difraktometer Panalytical Empyrean <\/strong><\/p>\n<p><u>Zodpovedn\u00fd pracovn\u00edk<\/u>:<\/p>\n<p>Tren\u010d\u00edn: doc. Ing. Du\u0161an Galusek, PhD.e-mail: dusan.galusek@tnuni.sk (Tren\u010d\u00edn)<\/p>\n<p>Bratislava: Ing. Iveta Mackov\u00e1 e-mail: iveta.mackova@savba.sk (Bratislava)<\/p>\n<ul>\n<li>kvalitat\u00edvna a\u00a0semikvantitat\u00edvna anal\u00fdza f\u00e1zov\u00e9ho zlo\u017eenia materi\u00e1lov, vr\u00e1tane vstupn\u00fdch surov\u00edn pre pr\u00edpravu skiel a\u00a0keramiky, f\u00e1zov\u00e9ho zlo\u017eenia keramick\u00fdch materi\u00e1lov a\u00a0kompozitov<\/li>\n<li>pr\u00eddavn\u00e9 zariadenia: vysokoteplotn\u00e1 cela (do 1600\u00b0C)<\/li>\n<li>humiditn\u00e1 a kryocela pre pr\u00e1cu v rozsahu od -170 do 600 \u00b0C a pri relat\u00edvnej vlhkosti od 0 do 95 % v teplotnom rozsahu od 25 do 100 \u00b0C (Tren\u010d\u00edn)<\/li>\n<\/ul>\n<p>&nbsp;<\/p>\n<p>&nbsp;<\/p>\n<p><strong>C\/S\u00a0 analyz\u00e1tor EMIA-320 V2 AC HORIBA Jobin Yvon<\/strong><br \/>\n<strong> O\/N\/H analyz\u00e1tor EMGA 830 AC HORIBA Jobin Yvon<\/strong><\/p>\n<p><u>Zodpovedn\u00fd pracovn\u00edk<\/u>: Miriam Hnatkov\u00e1 e-mail: uachmima@savba.sk<\/p>\n<ul>\n<li>Stanovenie obsahu prvkov v \u017eelezn\u00fdch aj v ne\u017eelezn\u00fdch zliatin\u00e1ch, v keramick\u00fdch a aj \u010fal\u0161\u00edch materi\u00e1loch, vr\u00e1tane organick\u00fdch,<\/li>\n<li>Je vhodn\u00fd pre vedecko-v\u00fdskumn\u00e9 \u00fa\u010dely ako aj pre priemyseln\u00e9 pou\u017eitie pri kontrole kvality rozli\u010dn\u00fdch materi\u00e1lov (ocel\u00ed, pal\u00edv, keramick\u00fdch materi\u00e1lov, katalyz\u00e1torov at\u010f.),<\/li>\n<li>kvalitat\u00edvna (identifik\u00e1cie funk\u010dn\u00fdch skup\u00edn) a semikvantitat\u00edvna anal\u00fdza.<\/li>\n<\/ul>\n<p><img loading=\"lazy\" decoding=\"async\" class=\"alignnone size-medium wp-image-666\" src=\"http:\/\/www.uach.sav.sk\/sk\/wp-content\/uploads\/sites\/2\/4_CHN-195x300.jpg\" alt=\"\" width=\"195\" height=\"300\" srcset=\"https:\/\/uach.sav.sk\/sk\/wp-content\/uploads\/sites\/2\/4_CHN-195x300.jpg 195w, https:\/\/uach.sav.sk\/sk\/wp-content\/uploads\/sites\/2\/4_CHN.jpg 378w\" sizes=\"auto, (max-width: 195px) 100vw, 195px\" \/> <img loading=\"lazy\" decoding=\"async\" class=\"alignnone wp-image-667\" src=\"http:\/\/www.uach.sav.sk\/sk\/wp-content\/uploads\/sites\/2\/4_N-ana-300x288.jpg\" alt=\"\" width=\"310\" height=\"300\" \/><\/p>\n<p>&nbsp;<\/p>\n","protected":false},"excerpt":{"rendered":"<p>Skenovac\u00ed elektr\u00f3nov\u00fd mikroskop JEOL EVO\u00ae 40 Series (Bratislava) Zodpovedn\u00fd pracovn\u00edk: Anna Jurov\u00e1 e-mail: anna.jurova@savba.sk Pr\u00edstroj na detailn\u00fa mikro\u0161trukt\u00farnu a\u00a0chemick\u00fa anal\u00fdzu (EDS) materi\u00e1lov, rozl\u00ed\u0161enie 3.0 nm&#8230;<\/p>\n","protected":false},"author":1,"featured_media":0,"parent":37,"menu_order":5,"comment_status":"closed","ping_status":"closed","template":"","meta":{"footnotes":"","_links_to":"","_links_to_target":""},"class_list":["post-625","page","type-page","status-publish","hentry"],"_links":{"self":[{"href":"https:\/\/uach.sav.sk\/sk\/wp-json\/wp\/v2\/pages\/625","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/uach.sav.sk\/sk\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/uach.sav.sk\/sk\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/uach.sav.sk\/sk\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/uach.sav.sk\/sk\/wp-json\/wp\/v2\/comments?post=625"}],"version-history":[{"count":10,"href":"https:\/\/uach.sav.sk\/sk\/wp-json\/wp\/v2\/pages\/625\/revisions"}],"predecessor-version":[{"id":1880,"href":"https:\/\/uach.sav.sk\/sk\/wp-json\/wp\/v2\/pages\/625\/revisions\/1880"}],"up":[{"embeddable":true,"href":"https:\/\/uach.sav.sk\/sk\/wp-json\/wp\/v2\/pages\/37"}],"wp:attachment":[{"href":"https:\/\/uach.sav.sk\/sk\/wp-json\/wp\/v2\/media?parent=625"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}